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Availablity: In stock -
Availablity: In stock
Spectrophotometers and Spectrometers
XRD-7000 X-ray Diffractometers
Availablity:
In stock
Catalog/Part Number:
XRD-7000
Brand:
SHIMADZU
Supplier:
SHIMADZU
Supplier Location:
JAPAN
Inventory Weight:
unavailable
Unit of Measurement:
Inventory Brochure:
1567678241.pdf |
Catalog/Part Number:: XRD-7000
Description
The new XRD-7000 Series X-ray diffractometers feature a high-precision vertical θ-θ goniometer and are able to handle huge samples than conventional instruments - up to W400 × D550 × H400mm. In addition to basic qualitative and quantitative analysis, the XRD-7000 Series handles residual austenite quantitation, environmental quantitative analysis, precise lattice constant determination, degree of crystallinity calculations, crystallite size and crystal strain calculations, crystal system determination, as well as Rietveld analysis and other software-based crystal structure analysis. The addition of attachments permits stress measurements, measurements on non-ambient condition, and the measurement of thin-film samples. The newly developed large R-θ stage permits automatic stress mapping of an entire sample up to 350 mm diameter. The strong parallel beam optical system with built-in polycapillary unit is available to further expand the range of application.
Feature
- High-precision vertical θ-θ goniometer
- Comprehensive range of options expand the system
- WINDOWS 7-compatible
- Safety-first design
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