Infrared Microscope AIM-9000

Description

The AIM-9000 incorporates a bright, optimized optical system and a high-sensitivity MCT detector. Not only enabling high-sensitivity measurement of micro samples, but the system has also been automated to ensure all steps involved in micro analysis can be performed quickly and easily.

Features of the AIM-9000

• Incorporates a bright, optimized optical system and a high-sensitivity MCT detector to enable high-sensitivity measurement.
• Enables reflection/ATR measurements on samples up to 40 mm thick.
• Comes with a digital zoom function of up to 330× magnification using the wide-view camera (optional) and the microscope camera. Enables the measurement position to be quickly determined.
• Includes an automatic contaminant recognition system that automatically determines the measurement position as a standard feature.
• Up to 60 measurement position can be recorded.
• Includes a contaminant analysis program to identify the cause of failures as a standard feature.

Note: In order to use this attachment, an external beam extraction kit (P/N 206-32570-42), an AIM connection kit (P/N 206-32607-42), and accessories for the AIM-9000 (P/N 206-32799-41) are required.