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Scanning Microscopes
High Resolution Scanning Probe Microscope
Availablity:
In stock
Catalog/Part Number:
SPM-8100FM
Brand:
SHIMADZU
Supplier:
SHIMADZU
Supplier Location:
JAPAN
Inventory Weight:
unavailable
Unit of Measurement:
Inventory Brochure:
c147e016a.pdf |
Catalog/Part Number:: SPM-8100FM
Description
The new HR-SPM scanning probe microscope uses frequency detection.
This instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
Existing SPMs (scanning probe microscopes) and AFMs (atomic force microscopes) generally use AM (amplitude modulation). In principle however, the FM (frequency modulation) measurement method enables higher imaging resolution.
Features of the HR-SPM
High Resolution
- Uses the FM method
- Noise in air and liquids is reduced to 1/20 that of existing methods.
- Achieves the performance level of a vacuum-type SPM, even in air and liquids.
- Enables measurement of the local structure at the solid-liquid interface.
Technical Specifications
| Displacement
detection system | Light source/optical lever/detector |
| Light source | Laser diode (635 nm, 5 mW max., switchable ON/OFF)
Irradiates cantilever continuously, even while replacing samples. |
| Detector | Photodetector |
| Max. sample size | 38 mm dia. × 8 mm |
| Sample
replacement method | Head-slide mechanism |
| Sample
securing method | Magnet |
| CCD | Element size: 1/3 inch |
| Vibration damper | Built into SPM unit |
| SPM head
movement range | 10mm x 10mm |
| Illumination | Coaxial incident illumination |
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