High Resolution Scanning Probe Microscope
Catalog/Part Number:: SPM-8100FM
The new HR-SPM scanning probe microscope uses frequency detection.
This instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
Existing SPMs (scanning probe microscopes) and AFMs (atomic force microscopes) generally use AM (amplitude modulation). In principle however, the FM (frequency modulation) measurement method enables higher imaging resolution.
Features of the HR-SPM
- Uses the FM method
- Noise in air and liquids is reduced to 1/20 that of existing methods.
- Achieves the performance level of a vacuum-type SPM, even in air and liquids.
- Enables measurement of the local structure at the solid-liquid interface.
detection system||Light source/optical lever/detector|
|Light source ||Laser diode (635 nm, 5 mW max., switchable ON/OFF)
Irradiates cantilever continuously, even while replacing samples.|
|Max. sample size||38 mm dia. × 8 mm|
replacement method||Head-slide mechanism |
securing method ||Magnet|
|CCD||Element size: 1/3 inch|
|Vibration damper||Built into SPM unit|
movement range||10mm x 10mm|
|Illumination||Coaxial incident illumination|